I am using a spectrophotometer (at normal incidence) to obtain an interference pattern from a thin, plano, lacquered lens. The lens is lacquered on both sides, and I am unable to view anything other than the combined effect of both interference patterns.
My question is, in general, if I ignore the beating effects, and take wavelength measurements of successive peaks and/or troughs; can I use the same analysis procedure as from a single layer pattern to find a useful estimate of the lacquer thickness?
(I have tried creating imaginary data mathematically, then analysing it by different means including a Fast Fourier Transform. So far the results have been more or less reasonable, but sometimes smaller or larger than either actual film thicknesses.) Is this the best I can hope for, or is there a better method?
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